Senior researcher
Atom Probe Tomography (APT) is a powerful tool for the semiconductor industry, offering the unique ability to identify and map the chemical identity and location of individual atoms with spatial resolution at or below the smallest critical dimensions found in modern devices. These capabilities have led most major semiconductor manufacturers to install APT systems at their manufacturing facilities and/or R&D labs. Significant advances in the technique have been made in recent years, however, it is still limited by measurement inaccuracies that may be overcome by using standards. This project will produce a series of industrially relevant reference materials, data sets, and standard practices that will improve the accuracy and repeatability of quantitative measurements made by APT.
Standards Development for Atom Probe Tomography
Required Qualifications:
- PhD or equivalent experience in Materials Science, Physics, or other related field
- Experience with standard nanofabrication processes such as lithography, thin film deposition, dry and wet etching, etc.
- Strong written and oral communication skills
- Ability to work independently and as part of a team
Preferred Additional Skills:
- Knowledge of modern semiconductor device design and materials, especially gate-all-around transistors
- Experience with semiconductor foundry PDKs and MPW services
- Familiarity with APT sample prep, experiments, and data analysis
Experience with other standard semiconductor materials characterization techniques such as SEM, TEM, SIMS, SRP, etc.
Primary Duties:
- Design and fabrication of reference materials containing known compositions and nanoscale 3-D structures. This includes both hands-on in the CNST Nanofab and through interactions with external vendors, such as foundries.
- Organize and analyze results from inter-laboratory studies to determine consensus measurand values from these reference materials and appropriateness for semiconductor applications