Postdoctoral researcher

Project
PREP0003261

The candidate will join a team of researchers working with advanced metrology methods to characterize, local physical and chemical properties and map any variation in these properties of thin, nanometer-scale films (oxides, nitrides, carbides, germinides) deposited on Si and SiC wafers.  The candidate will plan and conduct research using X-ray reflectivity, X-ray fluorescence spectroscopy, and X-ray photoelectron spectroscopy to determine through hybrid metrology, open-source, analysis methods, structural maps for wafers with thin films of essential interest to the semiconductor community. 

Materials Research Scientist (CHIPS Project: Nanometer-Scale Planar Reference Materials)

Qualifications
  • PhD in physics, materials science, or another related field
  • Background in X-ray measurement technique(s) required, either:
    • X-ray reflectivity, X-ray fluorescence, or X-ray photoelectron spectroscopy
  • Background in programming and/or data modeling using python (or equivalent) recommended.
  • Familiarity with thin film deposition and clean room access protocols, preferred
  • Strong oral and written communication skills
  • Ability to work productively as part of a team and independently
Research Proposal

Key responsibilities will include but are not limited to:

  • Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers.
  • Use X-ray characterization methods, such as X-ray reflectivity, X-ray fluorescence, X-ray photoelectron spectroscopy, to determine the structural properties of thin film samples.
  • Use open-source (python) fitting methods to constrain structural models, determine uncertainties, and combined these properties into a hybrid metrology digital wafer.
  • Perform wafer dicing, cleaning, and packaging of samples for distribution as a Research Grade Test Material to pair with the previously-determined digital wafer model.
  • Publish results in refereed scientific journals and present results at conferences and meetings.
NIST Sponsor
Donald Windover
Group
Microscopy and Microanalysis Research Group
Salary / Hourly Rate {Min}
$75,000.00
Schedule of Appointment
Full time
Start Date
Sponsor email
donald.windover@nist.gov
Work Location
Onsite NIST
Salary / Hourly rate {Max}
$90,000.00
Total Hours per week
40
End Date
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