Postdoctoral Research Associate in Electron Microscopy for Strain Measurement (CHIPS Funded Project)

Overview

The work will entail:
NIST is actively seeking a candidate for a postdoctoral research position as part of a project related to
the CHIPS for America Act. The project seeks to develop robust, quantitative methods for measuring
mechanical strain in real-world semiconductor devices. Geometric complexity and the importance of
strain in state-of-the-art nanoelectronics continue to increase, and this project is focused on improving
the accuracy of existing techniques (EBSD, TKD, 4-D STEM, Raman, µXRD, etc.) and supplying new
reference materials to industry to ensure capabilities for future-generation devices.

Qualifications

• Ph.D. in Physics, Materials Science, or a related field with a concentration in electron microscopy methods
• Experience in the collection and processing of TEM/STEM data
• Computer programming for custom data processing
• Strong oral and written communication skills.

Research Proposal

Key responsibilities will include but are not limited to:

• Sample preparation via focused ion beam methods
• Collecting and processing of 4DSTEM and other electron microscopy data
• Presenting results at internal meetings, and occasional meetings with external stakeholders
• Ensuring that results, protocols, software, and documentation have been archived or otherwise transmitted to the larger organization.