Postdoctoral Research Associate in Electron Microscopy(Chips Funded Project)

Overview

The work will entail:
NIST is actively seeking a candidate for a postdoctoral research position as part of a project related to
the CHIPS for America Act. The project seeks to develop quantitative, atomic-resolution methods for
the three-dimensional characterization of complex semiconductor devices via electron tomography. By
coupling advance specimen preparation, cutting-edge electron microscopy instrumentation, and AI-
driven data collection and reconstruction, we will deliver a robust suite of measurement tools to the
semiconductor industry.

Qualifications

• Ph.D. in Physics, Materials Science, or a related field with a concentration in electron microscopy methods
• Experience in the collection and processing of TEM/STEM data
• Computer programming for custom data processing
• Strong oral and written communication skills.

Research Proposal

Key responsibilities will include but are not limited to:

• Sample preparation via focused ion beam methods
• Collecting and processing of TEM tomography data
• Presenting results at internal meetings, and occasional meetings with external stakeholders.
• Ensuring that results, protocols, software, and documentation have been archived or otherwise transmitted to the larger organization.