Materials Research Scientist (CHIPS Project: Nanometer-Scale Planar Reference Materials)

Overview

The candidate will join a team of researchers working with advanced metrology methods to characterize, local physical and chemical properties and map any variation in these properties of thin, nanometer-scale films (oxides, nitrides, carbides, germinides) deposited on Si and SiC wafers. The candidate will plan and conduct research using X-ray reflectivity, X-ray fluorescence spectroscopy, and X-ray photoelectron spectroscopy to determine through hybrid metrology, open-source, analysis methods, structural maps for wafers with thin films of essential interest to the semiconductor community.

Qualifications

• PhD in physics, materials science, or another related field
• Background in X-ray measurement technique(s) required, either:
  • X-ray reflectivity, X-ray fluorescence, or X-ray photoelectron spectroscopy
• Background in programming and/or data modeling using python (or equivalent) recommended.
• Familiarity with thin film deposition and clean room access protocols, preferred
• Strong oral and written communication skills
• Ability to work productively as part of a team and independently

Research Proposal

Key responsibilities will include but are not limited to:

• Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers.
• Use X-ray characterization methods, such as X-ray reflectivity, X-ray fluorescence, X-ray photoelectron spectroscopy, to determine the structural properties of thin film samples.
• Use open-source (python) fitting methods to constrain structural models, determine uncertainties, and combined these properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as a Research Grade Test Material to pair with the previously-determined digital wafer model.
• Publish results in refereed scientific journals and present results at conferences and meetings.